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Séminaire interne Spintec

Measuring MRAM with Scanning NV Microscopy

Mardi 07 mars 2023 à 16:00, Salle de séminaire 445, bâtiment 1005, CEA-Grenoble

Publié le 7 mars 2023
Mathieu MUNSCH
CEO and Co-founder of QNAMI
We present results from the analysis of STT-MRAM arrays using scanning NV microscopy (SNVM). I will show how SNVM is used to analyze switching statistics of individual STT-MRAM bits. We introduce a method to analyze the variation in switching behavior, originating from local imperfections. We show how SNVM can be used provide unique insights into possible failure mechanisms (such as process variations and magnetic cross talks).

Plus d'information :https://www.spintec.fr/seminar-measuring-mram-with-scanning-nv-microscopy/

Pour suivre le seminaire en visioconférence : https://webconf.cea.fr/ioan-lucian.prejbeanu/C89D5FFJ?sl=1